X-Ray Absorption Correction for Quantitative Scanning Transmission Electron Microscopic Energy-Dispersive X-Ray Spectroscopy of Spherical Nanoparticles

Thomas Slater; Yiqiang Chen; Gregory Auton; Nestor Zaluzec; Sarah Haigh

doi:10.1017/S1431927616000064

X-Ray Absorption Correction for Quantitative Scanning Transmission Electron Microscopic Energy-Dispersive X-Ray Spectroscopy of Spherical Nanoparticles

Thomas Slater^*, Yiqiang Chen, Gregory Auton, Nestor Zaluzec, Sarah Haigh

^*Corresponding author for this work

The University of Manchester

Argonne National Laboratory

Research output: Contribution to journal › Article › peer-review

Abstract

A new method to perform X-ray absorption correction for spherical particles in quantitative energy-dispersive X-ray spectroscopy in the scanning transmission electron microscope is presented. An absorption correction factor is derived and simulated data is presented encompassing a range of X-ray absorption conditions. Theoretical calculations are compared with experimental data of X-ray counts from Au nanoparticles to verify the derived methodology. The effect of detector elevation angle is considered and a comparison with thin-film absorption correction is included.

Original language	English
Pages (from-to)	440-447
Number of pages	8
Journal	Microscopy and Microanalysis
Volume	22
Issue number	2
DOIs	https://doi.org/10.1017/S1431927616000064
Publication status	Published - 1 Apr 2016

Keywords

absorption correction
nanoparticles
quantification
STEM
XEDS

Access to Document

10.1017/S1431927616000064

Cite this

@article{5aa18b76838b49ac9f32a88281ec138f,

title = "X-Ray Absorption Correction for Quantitative Scanning Transmission Electron Microscopic Energy-Dispersive X-Ray Spectroscopy of Spherical Nanoparticles",

abstract = "A new method to perform X-ray absorption correction for spherical particles in quantitative energy-dispersive X-ray spectroscopy in the scanning transmission electron microscope is presented. An absorption correction factor is derived and simulated data is presented encompassing a range of X-ray absorption conditions. Theoretical calculations are compared with experimental data of X-ray counts from Au nanoparticles to verify the derived methodology. The effect of detector elevation angle is considered and a comparison with thin-film absorption correction is included.",

keywords = "absorption correction, nanoparticles, quantification, STEM, XEDS",

author = "Thomas Slater and Yiqiang Chen and Gregory Auton and Nestor Zaluzec and Sarah Haigh",

year = "2016",

month = apr,

day = "1",

doi = "10.1017/S1431927616000064",

language = "English",

volume = "22",

pages = "440--447",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "2",

}

TY - JOUR

T1 - X-Ray Absorption Correction for Quantitative Scanning Transmission Electron Microscopic Energy-Dispersive X-Ray Spectroscopy of Spherical Nanoparticles

AU - Slater, Thomas

AU - Chen, Yiqiang

AU - Auton, Gregory

AU - Zaluzec, Nestor

AU - Haigh, Sarah

PY - 2016/4/1

Y1 - 2016/4/1

N2 - A new method to perform X-ray absorption correction for spherical particles in quantitative energy-dispersive X-ray spectroscopy in the scanning transmission electron microscope is presented. An absorption correction factor is derived and simulated data is presented encompassing a range of X-ray absorption conditions. Theoretical calculations are compared with experimental data of X-ray counts from Au nanoparticles to verify the derived methodology. The effect of detector elevation angle is considered and a comparison with thin-film absorption correction is included.

AB - A new method to perform X-ray absorption correction for spherical particles in quantitative energy-dispersive X-ray spectroscopy in the scanning transmission electron microscope is presented. An absorption correction factor is derived and simulated data is presented encompassing a range of X-ray absorption conditions. Theoretical calculations are compared with experimental data of X-ray counts from Au nanoparticles to verify the derived methodology. The effect of detector elevation angle is considered and a comparison with thin-film absorption correction is included.

KW - absorption correction

KW - nanoparticles

KW - quantification

KW - STEM

KW - XEDS

UR - http://www.scopus.com/inward/record.url?scp=84968831231&partnerID=8YFLogxK

U2 - 10.1017/S1431927616000064

DO - 10.1017/S1431927616000064

M3 - Article

AN - SCOPUS:84968831231

SN - 1431-9276

VL - 22

SP - 440

EP - 447

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 2

ER -

X-Ray Absorption Correction for Quantitative Scanning Transmission Electron Microscopic Energy-Dispersive X-Ray Spectroscopy of Spherical Nanoparticles

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this