XPS surface analysis of ceria-based materials: Experimental methods and considerations

Mark A. Isaacs; Charalampos Drivas; Roxy Lee; Robert Palgrave; Christopher M. A. Parlett; David J. Morgan

doi:10.1016/j.apsadv.2023.100469

XPS surface analysis of ceria-based materials: Experimental methods and considerations

Mark A. Isaacs
, Charalampos Drivas
, Roxy Lee
, Robert Palgrave
, Christopher M. A. Parlett
, David J. Morgan

CE - Academic & Research

Research output: Contribution to journal › Article › peer-review

Original language	English
Article number	100469
Number of pages	8
Journal	Applied Surface Science Advances
Volume	18
DOIs	https://doi.org/10.1016/j.apsadv.2023.100469
Publication status	Published - Dec 2023

Keywords

Cerium
Surface analysis
X-ray Reduction
Xps

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10.1016/j.apsadv.2023.100469

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title = "XPS surface analysis of ceria-based materials: Experimental methods and considerations",

keywords = "Cerium, Surface analysis, X-ray Reduction, Xps",

author = "Isaacs, \{Mark A.\} and Charalampos Drivas and Roxy Lee and Robert Palgrave and Parlett, \{Christopher M. A.\} and Morgan, \{David J.\}",

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doi = "10.1016/j.apsadv.2023.100469",

language = "English",

volume = "18",

journal = "Applied Surface Science Advances",

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T2 - Experimental methods and considerations

AU - Isaacs, Mark A.

AU - Drivas, Charalampos

AU - Lee, Roxy

AU - Palgrave, Robert

AU - Parlett, Christopher M. A.

AU - Morgan, David J.

PY - 2023/12

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KW - Cerium

KW - Surface analysis

KW - X-ray Reduction

KW - Xps

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DO - 10.1016/j.apsadv.2023.100469

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JO - Applied Surface Science Advances

JF - Applied Surface Science Advances

M1 - 100469

ER -

XPS surface analysis of ceria-based materials: Experimental methods and considerations

Keywords

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